Brief: Aehr Announces New Advanced Testing Capabilities On Its Fox-P™ Wafer Level Test & Burn-In Systems
06/10/2022 21:46
Oct 6 (Reuters) - Aehr Test Systems AEHR.O :
* AEHR ANNOUNCES NEW ADVANCED TESTING CAPABILITIES ON ITS
FOX-P™
WAFER LEVEL TEST & BURN-IN SYSTEMS FOR SILICON CARBIDE AND
GALLIUM NITRIDE TECHNOLOGIES
Source text for Eikon: ID:nGNX7sK8WV
Further company coverage: AEHR.O
((Reuters.Briefs@thomsonreuters.com;))
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